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Showing posts with the label LED light driver

How to use LISUN ESD gun refer to IEC61000-4-2?

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The following are some of the general actions that need to be taken in order to utilize the LISUN ESD cannon for electrostatic discharge (ESD) testing in accordance with the standards of IEC 61000-4-2: Get the apparatus for the exam ready: During this step, you will set up the LISUN ESD gun, as well as the test fixtures and the measuring equipment. During the testing process, the test fixtures should be constructed to safely hold the LED light driver , and the measuring equipment should be calibrated and ready to go before the test begins. Configure the LISUN ESD gun: The LISUN ESD gun has to be set up so that it can produce discharge pulses that are in accordance with the specifications of the IEC 61000-4-2 standard. Among these configuration options are the discharge waveform, voltage level, and pulse duration settings. The LISUN ESD gun should also be set to discharge onto the particular pins, connections, or other places on the LED light driver that are defined in IEC 61000-4-2.

LED light driver test with an ESD generator gun

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An electrostatic discharge (ESD) test may be performed on an LED light driver with the assistance of an ESD generating gun. Testing for electrostatic discharge (ESD) is done to ensure that electrical and electronic products are resilient and safe against the effects of electrostatic discharge, which can result in the destruction of electronic components or even the total failure of the device if it is not properly protected. An electrostatic discharge (ESD) test involves exposing the LED light driver to a high-voltage discharge produced by the ESD generating gun . This discharge imitates the consequences of an electrostatic discharge that may happen out in the field, and it enables the manufacturer or the testing laboratory to assess the performance of the LED light driver under these particular circumstances. The LED light driver is subjected to a discharge from an ESD generating gun at various points during the testing process, including particular pins, connections, and other plac